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Job #: R-00013335
Location: Albany, OR
Category: Research Scientist
Schedule (FT/PT): Full time
Travel Required: No
Shift: Day
Potential for Telework: No
Clearance Required: None
Referral Eligibility: Ineligible
Group: Civil

Job Description:

We are currently seeking a Microstructure Analysis Scientist in Albany, OR to work onsite at the US-DOE operated National Energy Technology Laboratory (NETL).

In support of NETL's Research and Innovation Center (RIC), a Microstructure Analysis Scientist is needed with a background in metallurgy, materials science, or materials engineering as well as documented experience using transmission electron microscopy (TEM) to investigate the structure and performance of various materials (metals, ceramics, and/or composites).

Major Responsibilities Include:

Transmission Electron Microscopy (TEM):
  • Ability to prepare a wide range of materials for observation in the TEM. Must possess the knowledge to select the best approach to examining the material in the TEM and this includes preparing TEM specimens. Must possess the skill to execute the entire TEM specimen preparation activities principally for metals, but expertise in preparing ceramics and composite materials would be a benefit. Preparation skills shall include the following: selecting the most appropriate disk preparation approach for the sample of interest, sectioning as necessary using a range of medium and slow speed cutoff saws, grinding, and polishing to appropriate thickness. The candidate should also be knowledgeable in thinning metallic specimens (disk or equivalent) to electron transparency using electrochemical, precision ion polishing, and/or focused ion beam techniques. Must possess the knowledge to choose the most appropriate technique to minimize microstructural damage.
  • Routine operation of the TEM to include bright and dark field imaging as well as routine semi-quantitative x-ray analysis using TEM x-ray spectroscopy with associated software to include phase identification.
  • The candidate should be able to execute advanced operation of the TEM to include submicron and nano-scale phase identification in complex metallic, ceramic and/or composite materials using a combination of advanced imaging techniques, including but not limited to, weak beam microscopy, selected area diffraction (SAD), convergent beam electron diffraction (CBED), and scanning-transmission electron microscopy (STEM) utilizing CBED in the STEM mode. Must have a good working knowledge of crystallography and be able to interpret and index diffraction patterns while on the TEM (or through use of computer simulation software). Must have the ability to independently decide on the best imaging approach to obtain appropriate qualitative, semi-quantitative and quantitative information on microstructural features of interest in the material under investigation and be able to interpret the results in a written report of investigation.


Required Qualifications:
  • The candidate must have a Masters or PhD in metallurgy, materials science, or materials engineering with experience investigating the structure and performance of metal materials. Familiarity with ceramics and/or composite materials a plus.
  • Demonstrated hands-on expertise in TEM (outlined above) as documented by course work, thesis/dissertation, and/or peer reviewed publications.
  • The complexity of information and data to be managed requires excellent organizational skills and attention to detail.
  • Strong oral and written communication skills with ability to represent Battelle or its clients at conferences or public forums or contribute to technical reports and scientific journals.


Desired Qualifications:

Working knowledge of Scanning Electron Microscopy (SEM) and X-ray Diffraction (XRD) to resolve questions about materials of interest to NETL RIC. As such, it is desirable that the candidate possess the following skills:

SEM:
  • Ability to prepare a wide range of materials for observation in the SEM. The candidate shall possess the knowledge to select the best approach to examining the material in the SEM and if this includes mounting the specimen, then the candidate shall possess the skill to execute the preparation activities.
  • Routine operation of the SEM to include secondary electron imaging (SEI) and backscattered electron imaging (BEI) as well as semi-quantitative x-ray analysis using SEM x-ray detector software to include line scan operations and elemental mapping, or the ability to describe in detail what is needed in terms of information.

XRD:
  • The candidate shall possess the knowledge to select the best approach to examining the material in the XRD to identify crystal structure and secondary phases.
  • Determination of secondary phases based on SEM, TEM and other techniques.


Knowledge and complementary expertise in scanning electron microscopy (SEM) and x-ray diffraction (XRD) is also desired.

TERM OF COMMITMENT: These research positions are intended to be term positions, with varying levels of commitment that are not expected to last longer than 2 years. Candidates will be informed prior to applying what length of commitment is anticipated. Also, candidates who successfully fill a term position, may be invited to apply for an additional terms. Nothing in this paragraph is intended to create an employment contract. Employment will remain at will.

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